Abstract

We address the problem of weakly supervised object localization where only image-level annotations are available for training object detectors. Numerous methods have been proposed to tackle this problem through mining object proposals. However, a substantial amount of noise in object proposals causes ambiguities for learning discriminative object models. Such approaches are sensitive to model initialization and often converge to undesirable local minimum solutions. In this paper, we propose to overcome these drawbacks by progressive representation adaptation with two main steps: 1) classification adaptation and 2) detection adaptation. In classification adaptation, we transfer a pre-trained network to a multi-label classification task for recognizing the presence of a certain object in an image. Through the classification adaptation step, the network learns discriminative representations that are specific to object categories of interest. In detection adaptation, we mine class-specific object proposals by exploiting two scoring strategies based on the adapted classification network. Class-specific proposal mining helps remove substantial noise from the background clutter and potential confusion from similar objects. We further refine these proposals using multiple instance learning and segmentation cues. Using these refined object bounding boxes, we fine-tune all the layer of the classification network and obtain a fully adapted detection network. We present detailed experimental validation on the PASCAL VOC and ILSVRC datasets. Experimental results demonstrate that our progressive representation adaptation algorithm performs favorably against the state-of-the-art methods.

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Publication Details

Date of publication:
February 15, 2019
Journal:
IEEE Pattern Analysis and Machine Intelligence
Page number(s):
1424-1438
Volume:
42
Issue Number:
6
Publication note:

Dong Li, Jia-Bin Huang, Yali Li, Shengjin Wang, Ming-Hsuan Yang:Progressive Representation Adaptation for Weakly Supervised Object Localization. IEEE Trans. Pattern Anal. Mach. Intell. 42(6): 1424-1438 (2020)