• About
  • Research
  • Academics
  • People
  • News
  • Collaborate with Us
Virginia Tech
Sanghani Center for Artificial Intelligence and Data Analytics
  • About
  • Research
  • Academics
  • People
  • News
  • Collaborate with Us

News for the Publication Category: Americas Conf. on Information Systems

Identifying Product Defects from User Complaints: A Probabilistic Defect Model

Edward Fox
In Proceedings of the Americas Conf. on Information Systems, (pp ), 08/2016
Citatations: BibTeX

Discovery Analytics Center

Copyright © 2023 Sanghani Center for Artificial Intelligence and Data Analytics

  • Blacksburg
  • Falls Church
  • Arlington
  • Job Openings
  • Privacy Policy
  • Follow Us on Twitter
  • Follow Us on Facebook